JEDEC

JEDEC EIA 318-B

JEDEC EIA 318-B

MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES

JEDEC EIA 323 (R2002)

JEDEC EIA 323 (R2002)

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

JEDEC EIA 365 (R1984)

JEDEC EIA 365 (R1984)

PERFORMANCE TEST PROCEDURE FOR SOLAR CELLS AND CALIBRATION PROCEDURE FOR SOLAR CELL STANDARDS FOR SP

JEDEC EIA 397

JEDEC EIA 397

RECOMMENDED STANDARD FOR THYRISTORS

JEDEC EIA 397-1

JEDEC EIA 397-1

ADDENDUM No. 1 TO EIA-397

JEDEC EIA 557B

JEDEC EIA 557B

STATISTICAL PROCESS CONTROL SYSTEMS

JEDEC EIA 670

JEDEC EIA 670

QUALITY SYSTEM ASSESSMENT (SUPERSEDES JESD39-A)

JEDEC J-STD-020D.01

JEDEC J-STD-020D.01

JOINT IPC/JEDEC STANDARD FOR MOISTURE/REFLOW SENSITIVITY CLASSIFICATION FOR NONHERMETIC SOLID STATE

JEDEC J-STD-020E

JEDEC J-STD-020E

JOINT IPC/JEDEC STANDARD FOR MOISTURE/REFLOW SENSITIVITY CLASSIFICATION FOR NONHERMETIC SOLID STATE

JEDEC J-STD-033B.1

JEDEC J-STD-033B.1

JOINT IPC/JEDEC STANDARD FOR HANDLING, PACKING, SHIPPING AND USE OF MOISTURE/REFLOW SENSITIVE SURFAC

JEDEC J-STD-033C

JEDEC J-STD-033C

JOINT IPC/JEDEC STANDARD FOR HANDLING, PACKING, SHIPPING AND USE OF MOISTURE/REFLOW SENSITIVE SURFAC

JEDEC J-STD-035

JEDEC J-STD-035

JOINT IPC/JEDEC STANDARD FOR ACOUSTIC MICROSCOPY FOR NONHERMETRIC ENCAPSULATED ELECTRONIC COMPONENTS

JEDEC J-STD-048

JEDEC J-STD-048

Notification Standard for Product Discontinuance

JEDEC J-STD-609

JEDEC J-STD-609

MARKING AND LABELING OF COMPONENTS, PCBs AND PCBAs TO IDENTIFY LEAD (Pb), Pb-FREE AND OTHER ATTRIBUT

JEDEC J-STD-609A.01

JEDEC J-STD-609A.01

AND LABELING OF COMPONENTS, PCBs AND PCBAs TO IDENTIFY LEAD (Pb), Pb-FREE AND OTHER ATTRIBUTES

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